| سال | هفته | ID | Title | ApplNo | IPC | Applicant | Subgroup | زیر گروه | رشته | شرح | Description |
|---|
2026 | 03 | WO/2026/012284 | CONTROL METHOD FOR RADIO FREQUENCY SYSTEM USED IN SEMICONDUCTOR PROCESS DEVICE | CN2025/107059 | H01J 37/32 | BEIJING NAURA MICROELECTRONICS EQUIPMENT CO., LTD. | ELECTRICITY | الکتریسیته | دانش هسته ای | 2026 | 03 | WO/2026/012678 | GYROTRON SYSTEM COMPRISING INTEGRATED SUPERCONDUCTING MAGNET AND CAVITY | EP2025/066609 | H01J 23/00 | ETH ZURICH | ELECTRICITY | الکتریسیته | دانش هسته ای | 2026 | 03 | WO/2026/012760 | BEAM GENERATING DEVICE FOR A MULTIPLE PARTICLE BEAM SYSTEM AND MULTIPLE PARTICLE BEAM SYSTEM | EP2025/068063 | H01J 37/063 | CARL ZEISS MULTISEM GMBH | ELECTRICITY | الکتریسیته | دانش هسته ای | 2026 | 03 | WO/2026/012882 | SAMPLE CARRIER FOR PREPARING A SAMPLE FOR ELECTRON CRYO-MICROSCOPY ANALYSIS | EP2025/068951 | H01J 37/20 | UNIVERSITEIT MAASTRICHT | ELECTRICITY | الکتریسیته | دانش هسته ای | 2026 | 03 | WO/2026/013144 | SAMPLE BLOCK COMPRISING A MICROSAMPLE, METHOD FOR CREATING SUCH A SAMPLE BLOCK AND METHOD FOR SURFACE ANALYSIS USING MASS SPECTROMETRY OF A MICROSAMPLE IN SUCH A SAMPLE BLOCK | EP2025/069618 | H01J 49/04 | UNIVERSITEIT MAASTRICHT | ELECTRICITY | الکتریسیته | دانش هسته ای | 2026 | 03 | WO/2026/013404 | ION SEPARATORS | GB2025/051523 | H01J 49/00 | MICROMASS UK LIMITED | ELECTRICITY | الکتریسیته | دانش هسته ای | 2026 | 03 | WO/2026/013751 | CHARGED PARTICLE BEAM DEVICE AND SAMPLE INSPECTION METHOD | JP2024/024730 | H01J 37/22 | HITACHI HIGH-TECH CORPORATION | ELECTRICITY | الکتریسیته | دانش هسته ای | 2026 | 03 | WO/2026/014211 | IMAGE GENERATION DEVICE AND IMAGE GENERATION METHOD | JP2025/022479 | H01J 37/05 | TASMIT, INC. | ELECTRICITY | الکتریسیته | دانش هسته ای | 2026 | 03 | WO/2026/014873 | APPARATUS AND METHOD FOR INFERRING PARAMETER FOR CONTROLLING PLASMA EQUIPMENT | KR2025/009841 | H01J 37/32 | KOREA INSTITUTE OF FUSION ENERGY | ELECTRICITY | الکتریسیته | دانش هسته ای | 2026 | 03 | WO/2026/014874 | APPARATUS AND METHOD FOR INTELLIGENT OPERATION OF PLASMA EQUIPMENT | KR2025/009842 | H01J 37/32 | KOREA INSTITUTE OF FUSION ENERGY | ELECTRICITY | الکتریسیته | دانش هسته ای | 2026 | 03 | WO/2026/014911 | RPS ASSEMBLY AND SUBSTRATE PROCESSING DEVICE | KR2025/009933 | H01J 37/32 | TES CO.,LTD | ELECTRICITY | الکتریسیته | دانش هسته ای | 2026 | 03 | WO/2026/015207 | ION IMPLANTER, CONTROL SYSTEM, AND TECHNIQUES FOR TUNING ION IMPLANTER | US2025/030175 | H01J 37/317 | APPLIED MATERIALS, INC. | ELECTRICITY | الکتریسیته | دانش هسته ای | 2026 | 03 | WO/2026/015224 | MULTI-STAGE DYNAMIC VACUUM FEEDTHROUGH | US2025/031475 | H01J 37/32 | APPLIED MATERIALS, INC. | ELECTRICITY | الکتریسیته | دانش هسته ای | 2026 | 03 | WO/2026/015229 | WORKPIECE PROCESSING SYSTEM WITH MULTIPLE BEAM ANGLES | US2025/032151 | H01J 37/04 | APPLIED MATERIALS, INC. | ELECTRICITY | الکتریسیته | دانش هسته ای | 2026 | 03 | WO/2026/015230 | THERMALLY OPTIMIZED EXTRACTION PLATE FOR ION IMPLANTER | US2025/032153 | H01J 37/08 | APPLIED MATERIALS, INC. | ELECTRICITY | الکتریسیته | دانش هسته ای | 2026 | 03 | WO/2026/015231 | ION IMPLANTER ION SOURCE COUNTER EROSION ENDPLATE | US2025/032154 | H01J 27/02 | APPLIED MATERIALS, INC. | ELECTRICITY | الکتریسیته | دانش هسته ای | 2026 | 03 | WO/2026/015298 | WIDEBAND TEM TO TM01 MODE CONVERTER FOR MICROWAVE PLASMA SYSTEMS | US2025/035449 | H01J 37/32 | APPLIED MATERIALS, INC. | ELECTRICITY | الکتریسیته | دانش هسته ای | 2026 | 03 | WO/2026/015311 | SYSTEMS AND METHODS FOR PROVIDING AN HF RF SIGNAL TO AN UPPER ELECTRODE EXTENSION | US2025/035802 | H01J 37/32 | LAM RESEARCH CORPORATION | ELECTRICITY | الکتریسیته | دانش هسته ای | 2026 | 03 | WO/2026/015575 | ATMOSPHERIC PLASMA ACTIVATION FOR HYBRID BONDING | US2025/036868 | H01J 37/32 | APPLIED MATERIALS, INC. | ELECTRICITY | الکتریسیته | دانش هسته ای |